Hi Speed Testing

Spirit has at its disposal, a vast array of Automated Test Equipment (ATE) to meet the application specific need for the complexity of the device under test (DUT).  Our offering utilizes the best cost effective ATE for the DUT in order to maximize rate of return and optimization of test coverage per the data sheet. 

Electrical test data, tested over three temperatures, is uniquely specified to cover additional parameters to insure the quality and integrity of the device being used in critical applications.  Electrical test provides additional data to validate flight units for the life of the mission. 

Highlights

FPGA

ASIC

RF Components

Hi Speed Transceivers

Analog

Digital

Mixed Signal

Microprocessors

ADC/DAC