Radiation Effects Testing & Support

Spirit Electronics offers comprehensive radiation effects testing and support services, from electrical test, beam time, hardware and software development. 

Our MIL-STD radiation effects test services include: 

  • Determine the effects of gamma radiation on microelectronics and photonics components and systems.
  • Total Ionizing Dose (TID) and Device Testing per MIL-STD-750, MIL-STD-883, Method 1019 and ASTM F1892.
  • Enhanced Low Dose Radiation Sensitivity (ELDRS) Testing
  • 14 MeV Neutron Irradiator. Testing per MIL-STD-750 and MIL-STD-883, Method 1017
  • Radiation Lot Acceptance Testing (RLAT)
  • Heavy Ion Single Event Effects or SEE: Single Event Latch Up (SEL), Single Event Upset (SEU), Single Event Transient (SET), Single Event Burnout (SEB) and Single Event Gate Rapture (SEGR) - EIA/JESD 57, ASTM F1192
  • Radiation Engineering and Component Qualification Planning
  • Wafer Lot Radiation Screening, Characterization, and Qualification
  • MIL-STD-750 and MIL-STD-883 Screening, Reliability and Qualification of COTS Devices, FPGA’s as well as ASIC Design Engineering for Radiation Hardened Devices.


Support Services:
  • Chip Removal and Re-assembly for RAD Testing
  • Backside Chip Thinning and Re-assembly for Heavy Ion Radiation testing
  • PC Board Design, Quick-Turn Prototyping and Assembly
  • Radiation Test Engineering support including test plan development and test result reports.