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Electronics Analytical Services

Capabilities & Equipment

If your bottom line depends on high-quality analytical services, then a strong lab is your advantage. Choose an electronics analytical lab with a comprehensive set of analytical tools and techniques.

component screening and test services

Non-Destructive

  • Bench-top testing:  Curve Tracers, Logic Analyzer & Data Generator, Oscilloscope, etc.
  • Internal and external visual inspections
  • Acoustic Microscopy inspection
  • Real-Time X-ray Inspection
  • IR Microscopy (Thermal imaging)
  • X-ray Fluorescence (XRF)
  • Micro-FTIR (Organic substance identification)

Printed Circuit Board Assemblies

  • Visual Inspection (based on IPC specifications)
  • Cross-Sectioning
  • Potted Cross-Sectioning
  • Thermal (IR) Imaging
  • Dye and Pry (BGA package) Solderability Analysis
  • Hi-Pot & Insulation Resistance Testing
  • Heat Resistance, Solderability, etc.
  • High-speed & Low-Speed, Diamond Saws
  • Parallel Lapping

ICs, Discretes, Semiconductors

  • Cross-Sectioning
  • Potted Cross-Sections
  • Deprocessing – wet, dry and parallel lapping
  • Plastic Package Decappers 
  • Probe Station 
  • IR (thermal) Microscopy
  • SEM Inspection 
  • Focused Ion Beam (FIB) editing
  • FIB Cross-Sections
  • FIB TEM Prep and STEM/TEM Imaging
  • Photon Emission Microscopy (PEM aka LEM and EMMI)
  • Dry etching (oxides and package decaps)
  • SIMS and TOF-SIMS

Component Verification

  • Visual Inspection: Device markings, dimensions, lead finish, remarking
  • Datasheet comparison
  • X-Ray inspection
  • XRF inspection (RoHS)
  • Acoustical inspection
  • Decapsulation
  • Die inspection (low-mag, high-mag)
  • SEM inspection
  • Electrical Testing  (bench-top)
  • Cross-sectioning 
  • Deprocessing
  • Energy Dispersive Spectroscopy (EDS), Elemental Analysis
  • Custom solutions available