EPC is the leader in enhancement mode gallium nitride based power management devices. EPC was the first to introduce enhancement-mode gallium-nitride-on-silicon (eGaN) FETs as power MOSFET replacements in applications such as DC-DC converters, wireless power transfer, envelope tracking, RF transmission, power inverters, remote sensing technology (LiDAR), and Class-D audio amplifiers with device performance many times greater than the best silicon power MOSFETs.
GaN Reliability and Lifetime Projections: Phase 15
The rapid adoption of GaN devices in many diverse applications calls for continued accumulation of reliability statistics and research into the fundamental physics of failure in GaN devices, including integrated circuits (ICs). It is also necessary to look for information from real-world experience that either confirms the laboratory-derived data or opens new questions about mission robustness. This Phase 15 Reliability Report documents continued work using test-to-fail methodology and adds specific reliability metrics and predictions for solar optimizers, lidar sensors, and DC-DC converters.
The Value of Gallium Nitride Technology
The cost of electrical power is a key driver of socioeconomic vitality, as it enables us to improve our quality of life and advance new applications and industries. Silicon has hit its physical limits and, therefore, is no longer able to stay ahead of our demand for more and more efficient power. In order to re-establish momentum a new material is needed.
EPC is the leading provider of gallium nitride (GaN)-based power management technology and is doing more than just improving efficiency of electrical power. It is also enabling new, life-changing applications that didn’t exist five years ago. From wireless power and autonomous vehicles to high-speed mobile communications, low cost satellites, and transformations in medical care, among many others, GaN is becoming the preferred technology for progressive companies that are eager to remain at the forefront of their industries.
Ep. 49: EPC’s Progress in GaN Reliability in RadHard and New Space Applications
Listen in on this Spirit: Behind the Screen podcast episode when Marti chats with EPC’s CEO Alex Lidow and Marketing Director Renee Yawger about the progress of GaN. They discuss GaN’s performance under high radiation as well as the extensive testing, failure modes and device lifespan detailed in EPC’s Phase 15 reliability report. With the full potential of GaN still to be explored and new EPC products releasing frequently, including new half-bridge drivers, low-side drivers and full power stage, GaN is especially useful in New Space and commercial space applications.
